These are test results provided by Zero Error Systems.
Test
Findings
Proton Single-Event Effect on ZSOM-M01 (Zero Error Systems, 2024a)
No SEL observed with up to 200MeV proton energy at fluence up to 2.57x10
SEFI was observed, and a system reset could address the SEFI.
SEU was observed on the SRAM of the SAMD21 MCU.
Heavy-Ion Single Event Effect on ZES400-F/S-QFN28SP Quad-Channel Voter (Zero Error Systems, 2022b)
Single-Event Latch‐up (SEL) and Destructive Single Event Effects (DSEE):
ZES400 is SEL immune up to an LET of 110.1 MeV∙cm2/mg, the highest LET used during SEL testing, at the condition of a maximum power supply of +5V and heated to 125°C.
There were no destructive events observed during or after the SEL test runs.
Single-Event Transient (SET):
ZES400 is SET immune up to an LET of 83.3* MeV∙cm2/mg, and a fluence of 107 ions/cm2 at ambient temperature.
Total Ionizing Dose on ZES400 Quad-Channel Voter (Zero Error Systems, 2023b)
ZES400 remained fully functional up to TID of 300Krad (Si) @ Cobalt-60 source at the condition of a power supply of +5V and ambient temperature.
The current shift was within 1% during test runs up to 200 Krad (Si)
The current shift was within 7% during test runs up to 300 Krad (Si)
Single-Event Effects on ZES100F-QFN32SP Latchup Detection and Protection (LDAP) (Zero Error Systems, 2022a)
Single-Event Latch‐up (SEL) and Destructive Single Event Effects (DSEE):
ZES100F-QFN32SP is SEL immune up to a LET of 2/mg, the highest LET used during SEL testing, at the condition of a maximum power supply of +5V and heated to 125°C.
There were no destructive events observed during or after the SEL test runs.
Single Event Upset (SEU) and Single Event Transient (SET):
ZES100F-QFN32SP LET used during SEL testing, at room temperature.
ZES100F-QFN32SP Functionality o 2 /mg, the highest
When a Commercial-Off-the-Shelf (COTS) device is irradiated, ZES100F-QFN32SP exhibits an immediate response to every SEL experienced by the COTS device.
Total Ionizing Dose on ZES100F-QFN32SP Latchup Detection and Protection (LDAP) (Zero Error Systems, 2023a)
Shows SEE error-free up to Linear Energy Transfer (LET) of 2/mg
3 samples of ZES100F-QFN32SP are tested up to 300Krad at the dose rate of ~13.88rad(Si)/s, and another 3 samples of ZES100F-QFN32SP are tested up to 50Krad at the dose rate of ~2.3rad(Si)/s. All 6 samples remain functional and pass the tests.
Table F-1. Findings from tests
It is observed from the testing that the ZSOM-M01 is resistant to damage from high levels of radiation. In addition to this, its various protection systems are immune from lasting damage, especially for the Quad-Channel Voter in for SEL and LDAP with SEE. This means that even if the microcontroller experiences SEE events from the high-energy particles in the Van Allen Belt, it can be reset reliably to remove the error.